E DIN EN 62483:2012-..
Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
DIN EN 62047-14:2012-10
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials.
STANDARD published on 1.10.2012
The information about the standard:
Designation standards: DIN EN 62047-14:2012-10
Publication date standards: 1.10.2012
SKU: NS-239565
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN
The category - similar standards:
Semiconductor devices in generalElectromechanical components in general
Annotation of standard text DIN EN 62047-14:2012-10 :
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 14: Verfahren zur Ermittlung der Grenzformänderung metallischer Dünnschichtwerkstoffe.
Similar standards:
1.2.2008
1.6.2011
1.12.2010
1.12.2010
WITHDRAWN
1.5.2012
WITHDRAWN
1.5.2014
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
