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Standard DIN EN 62047-2:2007-02 1.2.2007 preview

DIN EN 62047-2:2007-02

Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials.



STANDARD published on 1.2.2007


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The information about the standard:

Designation standards: DIN EN 62047-2:2007-02
Publication date standards: 1.2.2007
SKU: NS-239568
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in generalElectromechanical components in general

Annotation of standard text DIN EN 62047-2:2007-02 :

Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Teil 2: Prüfverfahren zur Zugbeanspruchung bei Dünnschicht-Werkstoffen.

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Latest update: 2026-01-09 (Number of items: 2 253 999)
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