Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

Standard published on 29.8.2006

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 4: Circuits integres d´interface)

Standard published on 23.4.1997

Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 5: Circuits integres semi-personnalises)

Standard published on 30.5.1997

Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Standard published on 30.8.2002

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Correction published on 12.8.2003

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 10: Chocs mecaniques - Dispositif et sous-ensemble)

Standard published on 27.4.2022

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Standard published on 12.4.2002

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Correction published on 30.1.2003

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 2 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Correction published on 13.8.2003

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 12: Vibrations, frequences variables)

Standard published on 13.12.2017