Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Standards IEC - International electro-technical commission - Page 392
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
Price display: excl. VAT
Displayed currency:
USD
Sort by:
IEC 60748-3-ed.1.0/Amd.2
Change
Show all technical information.
Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
(Amendement 2 - Dispositifs a semiconducteurs. Circuits integres. Troisieme partie: Circuits integres analogiques)
Change published on 8.2.1994
Selected format:Show all technical information.
IEC 60748-3-ed.1.0/Amd.2/Cor.1
Correction
Show all technical information.
Corrigendum 1 to Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
(Corrigendum 1 a l´amendement 2 - Dispositifs a semiconducteurs. Circuits integres. Troisieme partie: Circuits integres analogiques)
Correction published on 11.6.1996
Selected format:Show all technical information.
IEC 60748-4-1-ed.1.0
Show all technical information.
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Blank detail specification for linear digital-to-analogue converters (DAC)
(Dispositifs a semiconducteurs - Circuits integres - Partie 4: Circuits integres d´interface - Section 1: Specification particuliere cadre pour les convertisseurs lineaires numeriques-analogiques)
Standard published on 11.11.1993
Selected format:Show all technical information.
IEC 60748-4-2-ed.1.0
Show all technical information.
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue-to-digital converters (ADC)
(Dispositifs a semiconducteurs - Circuits integres - Partie 4: Circuits integres d´interface - Section 2: Specification particuliere cadre pour les convertisseurs lineaires analogiques-numeriques)
Standard published on 11.11.1993
Selected format:Show all technical information.
IEC 60748-4-3-ed.1.0
Show all technical information.
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
Standard published on 29.8.2006
Selected format:Show all technical information.
IEC 60748-4-ed.2.0
Show all technical information.
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 4: Circuits integres d´interface)
Standard published on 23.4.1997
Selected format:Show all technical information.
IEC 60748-5-ed.1.0
Show all technical information.
Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 5: Circuits integres semi-personnalises)
Standard published on 30.5.1997
Selected format:Show all technical information.
IEC 60749-1-ed.1.0
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)
Standard published on 30.8.2002
Selected format:Show all technical information.
IEC 60749-1-ed.1.0/Cor.1
Correction
Show all technical information.
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)
Correction published on 12.8.2003
Selected format:Show all technical information.
IEC 60749-10-ed.2.0
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 10: Chocs mecaniques - Dispositif et sous-ensemble)
Standard published on 27.4.2022
Selected format:Show all technical information.
Can we help you with something?
