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Standards IEC - International electro-technical commission - Page 392
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 60748-4-ed.2.0
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Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 4: Circuits integres d´interface)
Standard published on 23.4.1997
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IEC 60748-5-ed.1.0
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Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 5: Circuits integres semi-personnalises)
Standard published on 30.5.1997
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IEC 60749-1-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)
Standard published on 30.8.2002
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IEC 60749-1-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)
Correction published on 12.8.2003
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IEC 60749-10-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 10: Chocs mecaniques - Dispositif et sous-ensemble)
Standard published on 27.4.2022
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IEC 60749-11-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
Standard published on 12.4.2002
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IEC 60749-11-ed.1.0/Cor.1
Correction
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
Correction published on 30.1.2003
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IEC 60749-11-ed.1.0/Cor.2
Correction
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Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 2 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)
Correction published on 13.8.2003
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IEC 60749-12-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 12: Vibrations, frequences variables)
Standard published on 13.12.2017
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IEC 60749-13-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
(Dispositifs a seminconducteurs - Methodes d´essais mecaniques et climatiques - Partie 13: Atmosphere saline)
Standard published on 15.2.2018
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