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Standards IEC - International electro-technical commission - Page 393
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 60749-14-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 14: Robustesse des sorties (integrite des connexions))
Standard published on 7.8.2003
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IEC 60749-15-ed.3.0
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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 15: Resistance a la temperature de brasage pour dispositifs par trous traversants)
Standard published on 14.7.2020
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IEC 60749-15-ed.3.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Standard published on 14.7.2020
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IEC 60749-16-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 16: Detection de bruit d´impact de particules (PIND))
Standard published on 17.1.2003
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IEC 60749-17-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 17: Irradiation aux neutrons)
Standard published on 28.3.2019
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IEC 60749-18-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 18: Rayonnements ionisants (dose totale))
Standard published on 10.4.2019
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IEC 60749-18-ed.2.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Standard published on 10.4.2019
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IEC 60749-19-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 19: Resistance de la pastille au cisaillement)
Standard published on 13.2.2003
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IEC 60749-19-ed.1.0/Amd.1
Change
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
(Amendement 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 19: Resistance de la pastille au cisaillement)
Change published on 28.7.2010
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IEC 60749-19-ed.1.1+Amd.1-CSV
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Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 19: Resistance de la pastille au cisaillement)
Standard published on 29.11.2010
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