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Standards IEC - International electro-technical commission - Page 395
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 60749-23-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 23 : Duree de vie en fonctionnement a haute temperature)
Standard published on 9.12.2025
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IEC 60749-23-ed.2.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Standard published on 9.12.2025
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IEC 60749-24-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 24: Resistance a l´humidite acceleree - HAST sans polarisation)
Standard published on 27.11.2025
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IEC 60749-24-ed.2.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Standard published on 27.11.2025
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IEC 60749-25-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 25: Cycles de temperature)
Standard published on 11.7.2003
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IEC 60749-26-ed.5.0
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 26: Essai de sensibilite aux decharges electrostatiques (DES) - Modele du corps humain (HBM))
Standard published on 23.12.2025
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IEC 60749-26-ed.5.0-CMV
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Standard published on 23.12.2025
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IEC 60749-27-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Standard published on 18.7.2006
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IEC 60749-27-ed.2.0/Amd.1
Change
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Amendement 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Change published on 25.9.2012
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IEC 60749-27-ed.2.1+Amd.1-CSV
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Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques etclimatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Standard published on 25.9.2012
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