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Standards IEC - International electro-technical commission - Page 395
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 60749-20-ed.3.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Standard published on 31.8.2020
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IEC 60749-21-ed.3.0
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Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 21: Brasabilite)
Standard published on 9.12.2025
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IEC 60749-21-ed.3.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Standard published on 9.12.2025
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IEC 60749-22-1-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 22-1: Robustesse des contacts soudes - Methodes d’essais d’arrachement par traction des contacts soudes par fil)
Standard published on 26.11.2025
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IEC 60749-22-2-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 22-2: Robustesse des contacts soudes - Methodes d’essais de cisaillement des contacts soudes par fil)
Standard published on 26.11.2025
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IEC 60749-23-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 23 : Duree de vie en fonctionnement a haute temperature)
Standard published on 9.12.2025
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IEC 60749-23-ed.2.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Standard published on 9.12.2025
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IEC 60749-24-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 24: Resistance a l´humidite acceleree - HAST sans polarisation)
Standard published on 27.11.2025
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IEC 60749-24-ed.2.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Standard published on 27.11.2025
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IEC 60749-25-ed.1.0
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 25: Cycles de temperature)
Standard published on 11.7.2003
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