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Standards IEC - International electro-technical commission - Page 396
IEC – The company IEC is world-leading organization, which creates and issues International standards for all electrical, electronic and other related technologies known generally as electro-technologies. Wherever, there is electricity and electronics you can find the company IEC, which promotes the safety and performance, the environment, electrical energy efficiency and renewable energy. The company IEC also administers conformity assessment systems, which certify that the equipment, systems or components comply with International Standards of this company.
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IEC 60749-26-ed.5.0
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 26: Essai de sensibilite aux decharges electrostatiques (DES) - Modele du corps humain (HBM))
Standard published on 23.12.2025
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IEC 60749-26-ed.5.0-CMV
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Standard published on 23.12.2025
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IEC 60749-27-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Standard published on 18.7.2006
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IEC 60749-27-ed.2.0/Amd.1
Change
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Amendement 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Change published on 25.9.2012
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IEC 60749-27-ed.2.1+Amd.1-CSV
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Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques etclimatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
Standard published on 25.9.2012
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IEC 60749-28-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
(Dispositifs a semiconducteurs - Methodes d’essai mecaniques et climatiques - Partie 28: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de dispositif charge (CDM) - niveau du dispositif)
Standard published on 1.3.2022
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IEC 60749-28-ed.2.0-RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Standard published on 1.3.2022
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IEC 60749-29-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
(Dispositifs a semiconducteurs - Methodes d´essai mecaniques et climatiques - Partie 29: Essai de verrouillage)
Standard published on 7.4.2011
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IEC 60749-3-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 3: Examen visuel externe)
Standard published on 3.3.2017
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IEC 60749-30-ed.2.0
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Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 30: Preconditionnement des composants pour montage en surface non hermetiques avant les essais de fiabilite)
Standard published on 17.8.2020
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